In Situ Measurements Reveal Phase and Texture Evolution in Solution Deposited Pzt Thin Films

Heating rate during crystallization is known to affect the final texture obtained in lead zirconate titanate thin films. The transient/intermediate phases present in the thin film during perovskite phase nucleation have been suggested to cause this variation in texture with heating rate. To understand the interrelationship between the transient/intermediate phases and the texture in the final perovskite phase, in situ crystallization experiments were conducted at the Advanced Photon Source. The use of a synchrotron X-ray source allowed the measurement of phase information with a temporal resolution in seconds. The effect of different heating rates on phase and texture evolution is reported.